表1为活动到触发器的映射表。
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Table 1 Attributes identified when a defect is uncovered |
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|
Activity and Triggers |
Customer
Impact |
|
|
|
Inspection |
Unit Test |
Function
Test |
System Test |
|
|
|
|
Design conformance |
Simple path |
Coverage |
Workload/stress |
Installability |
|
Logic/data flow |
Complex path |
Variation |
Startup/restart |
Serviceability |
|
Lateral compatibility |
|
Sequencing |
Recovery/exception |
Standards |
|
Backward compatibility |
|
Interaction |
Hardware configuration |
Integrity/security |
|
Language dependency |
|
|
Software configuration |
Migration |
|
Concurrency |
|
|
Blocked test (formerly
Normal Mode) |
Reliability |
|
Internal document |
|
|
|
Performance |
|
Side effects |
|
|
|
Documentation |
|
Rare situations |
|
|
|
Requirements |
|
|
|
|
|
Maintenance |
|
|
|
|
|
Usability |
|
|
|
|
|
Accessibility |
|
|
|
|
|
Capability |
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修改缺陷时可用的属性：
Target（目标）—在哪里修改缺陷，如设计、代码、文档等。
Defect type（缺陷类型）—实际的修改类型。
Defect qualifier（缺陷限定：适用于缺陷类型）—捕捉的不存在、错误或无关的实施元素。
Source（来源）—缺陷的起源，一般如内部开发的代码、重用的代码、外包的代码或端口等。
Age（码龄）—缺陷对应的代码历史。
The attributes identified when a design or code defect is fixed are shown in Table 2.
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Table 2 Attributes identified when a design or code defect is fixed |
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Target |
Defect Type |
Qualifier |
Source |
Age |
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|
|
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Design/code |
Assignment/initialization |
Missing |
Developed in house |
Base |
|
|
Checking |
Incorrect |
Reused from library |
New |
|
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Algorithm/method |
Extraneous |
Outsourced |
Rewritten |
|
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Function/class/object |
|
Ported |
Refixed |
|
|
Timing/serialization |
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